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Advanced Materials Engineering Research Institute
  • About Us
    • About Us
    • NSF’s ERC
    • FAQs
    • Archives
  • Resources
    • Facilities & Services
    • Nanotechnology Related Resources
  • AMERI 2022 Conference
    • Abstract Submission
  • Contact Us
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Facilities & Services


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  • 3D Printing
  • Cleanroom
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Scanning Electron Microscope
Scanning Electron Microscope
Transmission Electron Microscope
Transmission Electron Microscope
Sample Prep Room Access
Sample Prep Room Access
Thermal Processes
Thermal Processes
Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM)
Low Resolution SEM
Low Resolution SEM
Energy Dispersive X-ray Spectroscopy (EDS)
Energy Dispersive X-ray Spectroscopy (EDS)
X-Ray Diffraction (XRD)
X-Ray Diffraction (XRD)
Differential Scanning Calorimetry (DSC)
Differential Scanning Calorimetry (DSC)
SDT
SDT
Focused Ion Beam (FIB)
Focused Ion Beam (FIB)
Microscopy Sample Coating (Au)
Microscopy Sample Coating (Au)
Microscopy Sample Coating (C)
Microscopy Sample Coating (C)
Screen Printer
Screen Printer
Cutting Laser
Cutting Laser
Training
Training
Engineering Services
Engineering Services
Analytical Services
Analytical Services
Tool Operation/ Gen. Labor
Tool Operation/ Gen. Labor
MTS Tensile Tester
MTS Tensile Tester
Omniprobe
Omniprobe
Vickers Hardness Test
Vickers Hardness Test
DRIE
DRIE
Dicing Saw
Dicing Saw
Clean Room Access (10 hr minimum)
Clean Room Access (10 hr minimum)
Ebeam Lithography
Ebeam Lithography
Photolithography
Photolithography
Laser Lithography UPG101
Laser Lithography UPG101
Parlyene Coating
Parlyene Coating
Reactive Ion Etching (RIE)
Reactive Ion Etching (RIE)
Ashing
Ashing
PVD; Sputtering (Base Metals)
PVD; Sputtering (Base Metals)
PVD; Evaporation (Base Metals)
PVD; Evaporation (Base Metals)
RTA
RTA
Wedge Bonder
Wedge Bonder
PECVD
PECVD
Hyrel Systems30M
Hyrel Systems30M
Formlabs Form 1+
Formlabs Form 1+
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ENG: 305.348.0273
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CS/IT: 305.348.7989

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Miami, FL 33174
CS/IT: 11200 SW 8th St, CASE 354
Miami, FL 33174

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