Material Characterization and Analysis


Equipment Suite

  •      Electron, Microscopy Equipment: SEM, TEM, FIB
  •      Microprobe
  •      AFM
  •      X-Ray Diffraction
  •      Thermal Analysis
  •      Mechanical Testing
  •      Optical Microscopy
  •      Elemental Analysis

 Remotely Accessible Tools

  • Phenom Table top SEM

 

You can view your sample in real time by accessing the computer desktop of our Table top SEM. Add a phone call, and you are able to provide instant feedback to the operator while viewing and Imaging your sample. Just ship us your sample and schedule your session!

Click here for Material Characterization and Analysis Equipment List


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