Material Characterization

  • Philips CM-200 200KeV Transmission Electron Microscope (TEM)
  • JEOL SEM 6330F Field Emission Scanning Electron Microscopy Secondary Electron Imaging (SEI) Back Scattering Imaging (BS) (Compositional and Topographic) (FEG-SEM) with Energy Dispersive Spectroscopy (EDS)
  • JEOL SEM 7000 plus Nabity E-Beam Lithography
  • JEOL Multi Beam FIB 4500 SEM plus Focus Ion Beam plus EDS plus Back Scattering Plus Omniprob Nanomanipulator
  • Phenom Table top SEM with remote access capability and ProSuite software package
  • Leco LM 810 Automated Micro-Hardener tester
  • Nano Indenter
  • Pelco SC-7 Auto Sputter Carbon Coater
  • Pelco SC-7 Auto Sputter Gold Coater
  • AFM Workshop Atomic Force Microscope (AFM
  • UST INNOWEP Universal Surface Tester and Profilometer
  • Buehler Versamet 3 Metallograph Microscope with Xpixel Image Analysis Software
  • Siemens 5000D X-ray Diffractometer (XRD)
  • Match 3.02 Phase Identification from Powder Diffraction with PDF4 Data Base
  • TA Instruments SDT Q600 Differential Scanning Calorimeter (DSC)-Thermogravimetric Analyzer (TGA)
  • Versamet Optical Microscope with Integrated Image Analysis System
  • Metallography Facility with Cutting, Mounting, and Polishing equipment
  • Nanovea Optical Profilometer

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