Florida International University

College of Engineering and Computing

Advanced Materials Engineering Research Institute

AMERI 2022 Conference

Scanning Electron Microscope

by Giuseppe Antonio Bianco | May 6, 2020

Scanning Electron Microscope Materials Characterization JEOL 6330F: Field Emission SEM w/ EDS Internal Rate: $40...

Transmission Electron Microscope

by Benjamin Boesl | Feb 19, 2020

Transmission Electron Microscope Materials Characterization Internal rate: $63...

Sample Prep Room Access

by Benjamin Boesl | Feb 19, 2020

Sample Prep Room Access Materials Characterization Internal rate: $4...

Thermal Processes

by Benjamin Boesl | Feb 19, 2020

Thermal Processes Materials Characterization Internal rate: $6...

Low Resolution SEM

by Benjamin Boesl | Feb 19, 2020

Low Resolution SEM Materials Characterization Internal rate: $12...