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Advanced Materials Engineering Research Institute
About Us
About Us
NSF’s ERC
FAQs
Archives
Resources
Facilities & Services
Nanotechnology Related Resources
Contact Us
Close
Scanning Electron Microscope
Transmission Electron Microscope
Sample Prep Room Access
Thermal Processes
Atomic Force Microscopy (AFM)
Low Resolution SEM
Energy Dispersive X-ray Spectroscopy (EDS)
X-Ray Diffraction (XRD)
Differential Scanning Calorimetry (DSC)
SDT
Focused Ion Beam (FIB)
Microscopy Sample Coating (Au)
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